Webinar: Molecular Contamination Control and its implementation in Semiconductor Cleanroom
Particle Measuring Systems (PMS) specializes in viable and nonviable particle counters and particle counting solutions that measure and monitor contamination levels in clean and controlled environments. Since 1972, PMS knowledgeable and experienced team has been developing innovative technologies to advance the cleanroom monitoring industry. Led by PMS technology which provides accurate and reliable results and information for clients, Particle Measuring Systems is one of the world’s leading companies and manufacturers for particle counting instruments, and molecular and microbial monitoring.
A cleanroom is a controlled environment to manufacture products to help improve yield and meet regulatory requirements. Particle Measuring Systems (PMS) lead this industry of cleanroom particle counters and contamination monitoring worldwide by actively developing their instruments to perfection. Anything less is unsatisfactory.
As part of Particle Measuring Systems (PMS) complete clean environment monitoring solutions (products and services), PMS provides you with Airborne Molecular Contamination (AMC) solutions.
In high-tech ultra-clean manufacturing processes, AMC can cause costly damage. PMS’s AMC monitors detect acids, amines, ammonia, and chlorides, helping you quickly identify problems and their location before your product is contaminated.
In this webinar, you will learn from our Speaker Jeff Lee on what is the molecular contamination and why is this important, sources and effects of molecular contamination, monitoring technologies and AMC monitoring strategies. Don’t miss out this golden opportunity!
Attend our Webinar for FREE and LEARN:
- What is molecular contamination?
- Why is this important?
- Sources and effects of molecular contamination
- Monitoring technologies
- AMC monitoring strategies
- Product applications
- Cleanroom and make-up air
- Photolithography and optics
- Chemical filters
- Recent AMC success use cases
- Summary
Event Info:
Date: 3rd August 2021
Time: 10.00am ~ 12.00pm
Duration: 2 Hours
Speaker: Jeff Lee (Electronic Division Application Manager (SEA)
